This paper presents a novel parametric thresholding procedure to reduce the effect of speckle noise in ultrasound (US) medical images. The method comprises the use of an adaptive data-driven exponential operator that operates on wavelet coefficients of the US image to suppress undesired effects of disturbances, preserving signal details. The obtained results demonstrate that the proposed denoising method increases the medical image quality and, therefore, it can be a useful tool in medical diagnosis.

This paper describes a theoretical approach to evaluate the uncertainty on the series and shunt resistances estimated by the seven-parameter (double diode) model of a photovoltaic (PV) cell using data commonly provided by panel manufacturers, measured environmental parameters, and semiempirical equations. After a brief survey on the state of the art and the treatment of the double-diode model, the procedure proposed by the authors, to estimate the unknown parameters, is illustrated. The theoretical expression of the uncertainty, which affects the estimation of the series and shunt resistances (namely, Rs and Rsh) of a PV cell, is then derived. A statistical analysis performed bymeans of a Monte Carlo simulation is in agreement with the theoretical expression of the uncertainty.

The paper presents ideas and observations about the use of the frequentist and the Bayesian approach to estimation and uncertainty. The merits and the pitfalls of the Bayesian approach, compared with the frequentist one, are illustrated using a simple example, which gives rise to an instructive paradox. The impact of the paradox on the GUM approach to uncertainty prescribed in Supplement 1 is highlighted and discussed.

The paper discuss the computation of the worst case uncertainty (WCU) in common measurement problems. The usefulness of computing the WCU besides the standard uncertainty is illustrated. A set of equations to compute the WCU in almost all practical situations is presented. The application of the equations to real-world cases is shown.

In the last few years measurements of electrical quantities have shown a noticeable trend especially toward a more and more wide range of frequencies. To understand this trend may be useful to know the history of a Technical Committee on “Measurement of Electrical Quantities”, the IMEKO TC4, history which is also a significant part of my life. I hope the reader will learn not only of the sequence of dates, but also of the humanity and commitment of the founding members, of the joys and difficulties that arise within a Technical Committee, and finally of the friendship among people from the entire world. The paper provides a survey of the TC4 life from 1979 to 2002, reporting on the Symposia, the Workshops and the round tables organized in that period. The most important events are mentioned with special reference to the historical context relevant to the measurement of electrical quantities. That period was crucial for the TC4 activities in the following years