Abstract

This paper describes a theoretical approach to evaluate the uncertainty on the series and shunt resistances estimated by the seven-parameter (double diode) model of a photovoltaic (PV) cell using data commonly provided by panel manufacturers, measured environmental parameters, and semiempirical equations. After a brief survey on the state of the art and the treatment of the double-diode model, the procedure proposed by the authors, to estimate the unknown parameters, is illustrated. The theoretical expression of the uncertainty, which affects the estimation of the series and shunt resistances (namely, Rs and Rsh) of a PV cell, is then derived. A statistical analysis performed bymeans of a Monte Carlo simulation is in agreement with the theoretical expression of the uncertainty.

Autore Pugliese

• Attivissimo Filippo , Savino Mario

Tutti gli autori

• Attivissimo, F , Di Nisio, A , Savino, M , Spadavecchia, M

Titolo volume/Rivista

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

Anno di pubblicazione

2012

ISSN

0018-9456

ISBN

Non Disponibile

Numero di citazioni Wos

Nessuna citazione

Ultimo Aggiornamento Citazioni

Non Disponibile

Numero di citazioni Scopus

44

Ultimo Aggiornamento Citazioni

2017-04-23 03:20:56

Settori ERC

Non Disponibile

Codici ASJC

Non Disponibile