Abstract

Contouring of surfaces covers both metrology measurements and determination of displacements. There are a variety of scientific methods and corresponding devices used in contouring problems. Optical methods of contouring (OMC) have been proven to compete with the high precision and accuracy of Coordinate Measurement Machines (CMM). A general model of moiré contouring was recently developed by C.A. Sciammarella and his collaborators. The model integrates concepts of projective geometry and differential geometry of surfaces and utilizes symmetric projectors to reproduce the condition of projection from infinity. For specimens with dimensions ranging from few mm to more than 1 m, the measuring system and software provided standard deviations of the measured values that can reach 1/500 of the theoretical sensitivity defined by the pitch of the utilized grating. This paper will discuss the most recent trends in the optical contouring of surfaces focusing in particular on how to extend the general model of moiré contouring to the measurement of the three-dimensional displacement field of objects of arbitrary shape.

Autore Pugliese

• Boccaccio Antonio , Lamberti Luciano , Pappalettere Carmine

Tutti gli autori

• Sciammarella CA , Boccaccio A , Lamberti L , Pappalettere C

Titolo volume/Rivista

Non Disponibile

Anno di pubblicazione

2013

ISSN

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ISBN

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Numero di citazioni Wos

Nessuna citazione

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Numero di citazioni Scopus

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Settori ERC

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Codici ASJC

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