Single AlxGa1-xAs nanowires probed by Raman spectroscopy

Abstract

The stoichiometry of single ternary III-V semiconductor nanowires was analyzed by Raman spectroscopy. Free-standing AlxGa1-xAs nanowires were obtained through metal organic vapor phase epitaxy (MOVPE) by the vapor liquid solid (VLS) mechanism on GaAs substrates. The as-grown nanowires were studied with a scanning confocal Raman spectrometer (spatial resolution approximate to 300 nm). They were located by Rayleigh imaging and individual nanowires selected for Raman spectroscopy. The acquired spectra exhibit 2-mode behavior. The stoichiometry of single nanowires was determined based on the frequencies of the GaAs- and AlAs-like transversal optical (TO) and longitudinal optical (LO) peaks with an accuracy of below 10%. Measurements at different positions along the axis revealed variations of the composition within single nanowires. This non-uniformity evidences that the nanowires possess an internal structure.


Autore Pugliese

Tutti gli autori

  • Buick B.; Speiser E.; Prete P.; Paiano P.; Lovergine N.; Richter W.

Titolo volume/Rivista

Physica status solidi. B, Basic research


Anno di pubblicazione

2010

ISSN

0370-1972

ISBN

Non Disponibile


Numero di citazioni Wos

Nessuna citazione

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Settori ERC

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Codici ASJC

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