Single AlxGa1-xAs nanowires probed by Raman spectroscopy
Abstract
The stoichiometry of single ternary III-V semiconductor nanowires was analyzed by Raman spectroscopy. Free-standing AlxGa1-xAs nanowires were obtained through metal organic vapor phase epitaxy (MOVPE) by the vapor liquid solid (VLS) mechanism on GaAs substrates. The as-grown nanowires were studied with a scanning confocal Raman spectrometer (spatial resolution approximate to 300 nm). They were located by Rayleigh imaging and individual nanowires selected for Raman spectroscopy. The acquired spectra exhibit 2-mode behavior. The stoichiometry of single nanowires was determined based on the frequencies of the GaAs- and AlAs-like transversal optical (TO) and longitudinal optical (LO) peaks with an accuracy of below 10%. Measurements at different positions along the axis revealed variations of the composition within single nanowires. This non-uniformity evidences that the nanowires possess an internal structure.
Autore Pugliese
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Buick B.; Speiser E.; Prete P.; Paiano P.; Lovergine N.; Richter W.
Titolo volume/Rivista
Physica status solidi. B, Basic research
Anno di pubblicazione
2010
ISSN
0370-1972
ISBN
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Numero di citazioni Wos
Nessuna citazione
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Codici ASJC
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