Abstract

In this work we present a study of the reflectivity from highly disordered silicon nanowire films as a function of the wire size. Arrays of Au-catalyzed Si wires with length and diameter ranging from 0.15-0.2 microns and 30-50 nm up to 20-25 microns and 200-250 nm, respectively, were grown on top of either SiO2(1 microns)/Si(100) or Si(100) substrates. The integrated total reflection was measured in the 190-2500 nm spectral range. The results show that, increasing the wire size, the optical behavior of the Si wire film can be gradually tuned from that of an optical coating characterized by a graded effective refractive index to that of an ensemble of diffuse optical reflectors. In addition, we show how the optical analysis provides some important indications concerning the structural properties of the nanowires.

Autore Pugliese

• Cuscuna' Massimo

Tutti gli autori

• A. Convertino; M. Cuscunà; F. Martelli

Titolo volume/Rivista

Nanotechnology

Anno di pubblicazione

2010

ISSN

0957-4484

ISBN

Non Disponibile

Numero di citazioni Wos

Nessuna citazione

Ultimo Aggiornamento Citazioni

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Numero di citazioni Scopus

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Ultimo Aggiornamento Citazioni

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Settori ERC

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Codici ASJC

Non Disponibile