Abstract

We explore the effects of substrate, grain size, oxidation and cleaning on the optical properties of chemical vapor deposited polycrystalline monolayer graphene exploiting spectroscopic ellipsometry in the NIR-Vis-UV range. Both Drude-Lorentz oscillators' and point-by-point fit approaches are used to analyze the ellipsometric spectra. For monolayer graphene, since anisotropy cannot be resolved, an isotropic model is used. A prominent absorption peak at approximately 4.8 eV, which is a mixture of pi-pi* interband transitions at the M-point of the Brillouin zone and of the pi-plasmonic excitation, is observed. We discuss the sensitivity of this peak to the structural and cleaning quality of graphene. The comparison with previous published dielectric function spectra of graphene is discussed giving a rationale for the observed differences. (C) 2014 Elsevier B.V. All rights reserved.

Autore Pugliese

• Bianco Giuseppe Valerio , Losurdo Maria , Giangregorio Maria Michela

Tutti gli autori

• Losurdo M.; Giangregorio M.M.; Bianco G.V.; Capezzuto P.; Bruno G.

Titolo volume/Rivista

Thin solid films

Anno di pubblicazione

2014

ISSN

0040-6090

ISBN

Non Disponibile

Numero di citazioni Wos

Nessuna citazione

Ultimo Aggiornamento Citazioni

Non Disponibile

Numero di citazioni Scopus

Non Disponibile

Ultimo Aggiornamento Citazioni

Non Disponibile

Settori ERC

Non Disponibile

Codici ASJC

Non Disponibile