Abstract

The paper focuses on the development of electron coherent diffraction imaging intransmission electron microscopy, made in the, approximately, last ten years in our collaborativeresearch group, to study the properties of materials at atomic resolution, overcoming the limitationsdue to the aberrations of the electron lenses and obtaining atomic resolution images, in whichthe distribution of the maxima is directly related to the specimen atomic potentials projected ontothe microscope image detector. Here, it is shown how augmented coherent diffraction imagingmakes it possible to achieve quantitative atomic resolution maps of the specimen atomic species,even in the presence of low atomic number atoms within a crystal matrix containing heavy atoms.This aim is achieved by: (i) tailoring the experimental set-up, (ii) improving the experimental data byproperly treating parasitic diffused intensities to maximize the measure of the significant information,(iii) developing efficient methods to merge the information acquired in both direct and reciprocalspaces, (iv) treating the dynamical diffused intensities to accurately measure the specimen projectedpotentials, (v) improving the phase retrieval algorithms to better explore the space of solutions.Finally, some of the future perspectives of coherent diffraction imaging in a transmission electronmicroscope are given.

Autore Pugliese

• Giannini Cinzia , Siliqi Dritan , Carlino Elvio

Tutti gli autori

• E. Carlino; F. Scattarella; L. De Caro; C. Giannini;D. Siliqi; A. Colombo; D. E. Galli

Titolo volume/Rivista

Materials

Anno di pubblicazione

2018

ISSN

1996-1944

ISBN

Non Disponibile

Numero di citazioni Wos

Nessuna citazione

Ultimo Aggiornamento Citazioni

Non Disponibile

Numero di citazioni Scopus

Non Disponibile

Ultimo Aggiornamento Citazioni

Non Disponibile

Settori ERC

Non Disponibile

Codici ASJC

Non Disponibile