Abstract

Photodetectors based on polycrystalline diamond (PCD) films are of great interest to many researchers for the attractive electronic, mechanical, optical and thermal properties. PCD films are grown using the Microwave Plasma Enhanced Chemical Vapor Deposition (MWPECVD) method. First, we characterized films by means of structural and morphological analysis (Raman spectroscopy and scanning electron microscopy), then we evaporated a pattern of coplanar interdigitated Cr/Au contacts with an inter-electrode spacing of 100 mu m in order to perform the electrical characterization. We carried out measurements of dark current and impedance spectroscopy to investigate the film properties and conduction mechanisms of films and the effects of post-growth treatments. Finally we developed a charge sensing pre-amplifier to read-out the signal produced by UV photons in the detector. (C) 2009 Elsevier B.V. All rights reserved.

Autore Pugliese

• De Giacomo Alessandro , Valentini Antonio , Loparco Francesco , Giordano Francesco , Acquafredda Pasquale , Fusco Piergiorgio , Longo Savino

Tutti gli autori

• DE GIACOMO A.;VALENTINI A.;GORSE C.;LOPARCO F.;GIORDANO F.;ACQUAFREDDA P.;FUSCO P.;LONGO S.

Titolo volume/Rivista

Non Disponibile

Anno di pubblicazione

2010

ISSN

0168-9002

ISBN

Non Disponibile

Numero di citazioni Wos

1

Ultimo Aggiornamento Citazioni

Non Disponibile

Numero di citazioni Scopus

Non Disponibile

Ultimo Aggiornamento Citazioni

Non Disponibile

Settori ERC

Non Disponibile

Codici ASJC

Non Disponibile