Electric field localizations in thin dielectric films with thickness non-uniformities

Abstract

Thickness non-uniformities in electrostatic capacitors and in electroactive polymers arising from manufacturing processes or electromechanical induced inhomogeneous deformations may lead todrastic charge and electric field localizations and, ultimately, to an anticipated device failure. Based on ageometric interpretation of the Gauss equation enlightening the effect of the electrode curvature, weobtain an analytic expression of the electric field and of the surface charge density localization for nonperfectly planar capacitors with symmetric thickness non-uniformities. The efficiency of the model isexploited by analyzing specific boundary value problems of technological interest.


Autore Pugliese

Tutti gli autori

  • Puglisi G , Zurlo G

Titolo volume/Rivista

JOURNAL OF ELECTROSTATICS


Anno di pubblicazione

2012

ISSN

0304-3886

ISBN

Non Disponibile


Numero di citazioni Wos

Nessuna citazione

Ultimo Aggiornamento Citazioni

Non Disponibile


Numero di citazioni Scopus

14

Ultimo Aggiornamento Citazioni

2017-04-22 03:20:59


Settori ERC

Non Disponibile

Codici ASJC

Non Disponibile