Electric field localizations in thin dielectric films with thickness non-uniformities
Abstract
Thickness non-uniformities in electrostatic capacitors and in electroactive polymers arising from manufacturing processes or electromechanical induced inhomogeneous deformations may lead todrastic charge and electric field localizations and, ultimately, to an anticipated device failure. Based on ageometric interpretation of the Gauss equation enlightening the effect of the electrode curvature, weobtain an analytic expression of the electric field and of the surface charge density localization for nonperfectly planar capacitors with symmetric thickness non-uniformities. The efficiency of the model isexploited by analyzing specific boundary value problems of technological interest.
Autore Pugliese
Tutti gli autori
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Puglisi G , Zurlo G
Titolo volume/Rivista
JOURNAL OF ELECTROSTATICS
Anno di pubblicazione
2012
ISSN
0304-3886
ISBN
Non Disponibile
Numero di citazioni Wos
Nessuna citazione
Ultimo Aggiornamento Citazioni
Non Disponibile
Numero di citazioni Scopus
14
Ultimo Aggiornamento Citazioni
2017-04-22 03:20:59
Settori ERC
Non Disponibile
Codici ASJC
Non Disponibile
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