Abstract

This paper deals with the uncertainty analysis of parameters estimated during long-term monitoring of photovoltaic plants. A specifically developed data-acquisition system is briefly described, which has been conceived to be easily calibrated and, if necessary, adjusted to compensate for measuring-chain drifts, in order to assure the traceability of the estimated parameters. The measurement capabilities of the acquisition system are reported in terms of measured quantities and expected uncertainty. Results that refer to a three-year monitoring of ten photovoltaic plants based on different technologies and architectures are reported. The obtained uncertainty is suitable to distinguish the behavior of the different plants, thus allowing a preliminary comparison to be performed among technologies and architectures. Experimental results highlight an important difference between crystalline silicon devices and thin film technologies in regards to degradation.

Autore Pugliese

• Attivissimo Filippo

Tutti gli autori

• A. CARULLO , F. FERRARIS , A. VALLAN , F. SPERTINO , ATTIVISSIMO F

Titolo volume/Rivista

MEASUREMENT

Anno di pubblicazione

2014

ISSN

0263-2241

ISBN

Non Disponibile

Numero di citazioni Wos

Nessuna citazione

Ultimo Aggiornamento Citazioni

Non Disponibile

Numero di citazioni Scopus

5

Ultimo Aggiornamento Citazioni

2017-04-23 03:20:56

Settori ERC

Non Disponibile

Codici ASJC

Non Disponibile