Thickness dependence of the amplified spontaneous emission threshold and operational stability in poly(9,9-dioctylfluorene) active waveguides

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Abstract

We investigate the thickness dependence of the amplified spontaneous emission (ASE) threshold and operational lifetime in air-poly(9,9-dioctylfluorene)(PF8)-glass asymmetric active waveguides. We show that the ASE threshold decreases with the film thickness up to about 200 nm, and increases for higher thicknesses. The ASE operational lifetime increases with the thickness up to about 300 nm, and it is almost thickness independent for higher thickness. We show that the observed results are related to the guided mode confinement in the waveguide and to the spatial overlap between the guided modes and the excited region in the film.

Autore Pugliese

Tutti gli autori

  • M. Anni , A. Perulli , G. Monti

Titolo volume/Rivista

JOURNAL OF APPLIED PHYSICS

Anno di pubblicazione

2012

ISSN

0021-8979

ISBN

Non Disponibile

Numero di citazioni Wos

8

Ultimo Aggiornamento Citazioni

28/04/2018

Numero di citazioni Scopus

8

Ultimo Aggiornamento Citazioni

28/04/2018

Settori ERC

Non Disponibile

Codici ASJC

Non Disponibile