Abstract

Antenna characterization measurements are traditionally performed in the frequency domain (FD) through vector network analyzers (VNAs) in anechoic chambers. Nevertheless, the expensiveness of these facilities limits the possibility of using this approach for routine measurements. In this chapter, the strategies for the accurate evaluation of the reflection scattering parameter (S 11(f)) of antennas, starting from simple time domain reflectometry (TDR) measurements, are described. As a matter of fact, not only are instruments operating in time domain (TD) usually less expensive than VNAs; but they allow performing time windowing, which is the key for excluding the unwanted spurious reflection from the environment, thus avoiding the use of anechoic chamber.

Autore Pugliese

• Cataldo Andrea Maria

Tutti gli autori

• Cataldo A. , De Benedetto E. , Cannazza G.

Titolo volume/Rivista

LECTURE NOTES IN ELECTRICAL ENGINEERING

Anno di pubblicazione

2011

ISSN

1876-1100

ISBN

Non Disponibile

Numero di citazioni Wos

Nessuna citazione

Ultimo Aggiornamento Citazioni

Non Disponibile

Numero di citazioni Scopus

Non Disponibile

0

Ultimo Aggiornamento Citazioni

28/04/2018

Settori ERC

Non Disponibile

Codici ASJC

Non Disponibile