SYSTEM FOR MEASURING THE DEFORMATION OF A STRUCTURE WITH INTERFEROMETRIC LASER SENSORS

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Abstract

System for measuring the deformation of a structure comprising a plurality of interferometric Laser sensors (L) mounted rigidly on the structure to form a measurement grid (RM) comprising at least one triangular grid, wherein on each side of the triangular grids are disposed an emitter and a reflecting target of a respective Laser sensor (L) for detecting a value being representative for the displacement of two points for each side of the triangular grids.

Classe Tecnologica

B - Performing operations, transporting

Patent Office

World Intellectual Property Organization

Numero Deposito

WO2011004307

Anno Deposito

2010

Anno Concessione

2011

Inventori Pugliesi

  • Cattani Enrico
  • Modica Francesco
  • Siddiolo Antonino

Tutti gli inventori

  • Enrico Cattani
  • Francesco Modica
  • Antonino Siddiolo

Titolari pugliesi

Tutti i titolari

  • Sintesi S.c.p.a.
  • Enrico Cattani
  • Francesco Modica
  • Antonino Siddiolo
  • Alessandro Brondi